Ting‐Chang Chang
Researcher Next ID · RN-019129
Researcher · Engineering
ON Semiconductor (United States)
Phoenix, Taiwan
- Works count
- 891
- Citation count
- 23,395
- H-index
- 62
- i10-index
- 390
Research interests
Publications
An electro-photo-sensitive synaptic transistor for edge neuromorphic visual systems
Nanoscale · 2019 · 10.1039/c9nr04195h
Optoelectronic neuromorphic thin-film transistors capable of selective attention and with ultra-low power dissipation
Nano Energy · 2019 · 10.1016/j.nanoen.2019.06.007
High-Performance Visible-Blind Ultraviolet Photodetector Based on IGZO TFT Coupled with p–n Heterojunction
ACS Applied Materials & Interfaces · 2018 · 10.1021/acsami.7b16498
Functionally Complete Boolean Logic in 1T1R Resistive Random Access Memory
IEEE Electron Device Letters · 2016 · 10.1109/led.2016.2645946
Physical and chemical mechanisms in oxide-based resistance random access memory
Nanoscale Research Letters · 2015 · 10.1186/s11671-015-0740-7
Resistance random access memory
Materials Today · 2015 · 10.1016/j.mattod.2015.11.009
Biorealistic Implementation of Synaptic Functions with Oxide Memristors through Internal Ionic Dynamics
Advanced Functional Materials · 2015 · 10.1002/adfm.201501427
Integrated One Diode–One Resistor Architecture in Nanopillar SiOx Resistive Switching Memory by Nanosphere Lithography
Nano Letters · 2013 · 10.1021/nl404160u
Building Neuromorphic Circuits with Memristive Devices
IEEE Circuits and Systems Magazine · 2013 · 10.1109/mcas.2013.2256260
Atomic-level quantized reaction of HfO x memristor
Applied Physics Letters · 2013 · 10.1063/1.4802821
Observation of conducting filament growth in nanoscale resistive memories
Nature Communications · 2012 · https://doi.org/10.1038/ncomms1737
Developments in nanocrystal memory
Materials Today · 2011 · 10.1016/s1369-7021(11)70302-9
Redox Reaction Switching Mechanism in RRAM Device With $\hbox{Pt/CoSiO}_{X}\hbox{/}\hbox{TiN}$ Structure
IEEE Electron Device Letters · 2011 · 10.1109/led.2011.2104936
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
Applied Physics Letters · 2011 · 10.1063/1.3609873
Synaptic behaviors and modeling of a metal oxide memristive device
Applied Physics A · 2011 · 10.1007/s00339-011-6296-1
Short-Term Memory to Long-Term Memory Transition in a Nanoscale Memristor
ACS Nano · 2011 · https://doi.org/10.1021/nn202983n
Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition
Applied Physics Letters · 2010 · 10.1063/1.3514251
Nanoscale Memristor Device as Synapse in Neuromorphic Systems
Nano Letters · 2010 · https://doi.org/10.1021/nl904092h
Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films
Applied Physics Letters · 2010 · 10.1063/1.3456379
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Applied Physics Letters · 2010 · 10.1063/1.3481676
Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor
Applied Physics Letters · 2010 · 10.1063/1.3453870
Multilevel resistive switching in Ti/CuxO/Pt memory devices
Journal of Applied Physics · 2010 · 10.1063/1.3518514
Hydrogen-induced improvements in electrical characteristics of a-IGZO thin-film transistors
Solid-State Electronics · 2010 · 10.1016/j.sse.2010.08.001
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
Applied Physics Letters · 2010 · 10.1063/1.3457996
Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory
Electrochemical and Solid-State Letters · 2010 · 10.1149/1.3360181
Current projects
No projects listed.