B. Kaczer

Researcher Next ID · RN-039674

Researcher · Engineering

Leuven, Belgium

Accepting doctoral researchersFunding unknown

Research interests

Engineering

Semiconductor materials and devices

Advancements in Semiconductor Devices and Circuit Design

Integrated Circuits and Semiconductor Failure Analysis

Ferroelectric and Negative Capacitance Devices

Advanced Memory and Neural Computing

Origin of NBTI variability in deeply scaled pFETs
Journal · 2010 · https://doi.org/10.1109/irps.2010.5488856
High-k dielectrics for future generation memory devices (Invited Paper)
Microelectronic Engineering · 2009 · https://doi.org/10.1016/j.mee.2009.03.045
Emerging yield and reliability challenges in nanometer CMOS technologies
Journal · 2008 · https://doi.org/10.1145/1403375.1403694
Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification
Journal · 2005 · https://doi.org/10.1109/relphy.2005.1493117
Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
IEEE Transactions on Electron Devices · 2002 · https://doi.org/10.1109/16.987122
Consistent model for short-channel nMOSFET after hard gate oxide breakdown
IEEE Transactions on Electron Devices · 2002 · https://doi.org/10.1109/16.987123

No projects listed.