N.P. Barradas
Researcher Next ID · RN-041134
Researcher · Engineering
Instituto de Engenharia de Sistemas e Computadores Investigação e Desenvolvimento
Lisbon, Portugal
- Works count
- 388
- Citation count
- 7,529
- H-index
- 41
- i10-index
- 209
Research interests
Publications
Ion beam analysis of fusion plasma-facing materials and components: facilities and research challenges
Nuclear Fusion · 2019 · 10.1088/1741-4326/ab5817
Solar selective absorbers based on Al2O3:W cermets and AlSiN/AlSiON layers
Solar Energy Materials and Solar Cells · 2015 · 10.1016/j.solmat.2015.01.029
Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry
Analytical Chemistry · 2012 · 10.1021/ac300904c
Tuning of the surface plasmon resonance in TiO2/Au thin films grown by magnetron sputtering: The effect of thermal annealing
Journal of Applied Physics · 2011 · 10.1063/1.3565066
Effect of free layer thickness and shape anisotropy on the transfer curves of MgO magnetic tunnel junctions
Journal of Applied Physics · 2008 · 10.1063/1.2838626
International Atomic Energy Agency intercomparison of ion beam analysis software
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 10.1016/j.nimb.2007.05.018
Summary of “IAEA intercomparison of IBA software”
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 10.1016/j.nimb.2007.10.043
Efficient dipole-dipole coupling of Mott-Wannier and Frenkel excitons in (Ga,In)N quantum well/polyfluorene semiconductor heterostructures
Physical Review B · 2007 · 10.1103/physrevb.76.035344
Advanced physics and algorithms in the IBA DataFurnace
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 10.1016/j.nimb.2007.10.044
Status of ion beam data analysis and simulation software
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2005 · 10.1016/j.nimb.2005.10.024
Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool
Journal of Physics D Applied Physics · 2003 · 10.1088/0022-3727/36/7/201
Graded selective coatings based on chromium and titanium oxynitride
Thin Solid Films · 2003 · 10.1016/s0040-6090(03)00967-2
Magnetoresistance enhancement in specular, bottom-pinned, Mn83Ir17 spin valves with nano-oxide layers
Applied Physics Letters · 2000 · 10.1063/1.1288672
Simulated annealing analysis of Rutherford backscattering data
Applied Physics Letters · 1997 · https://doi.org/10.1063/1.119524
Current projects
No projects listed.